Description
Automating test and measurement runs on substrates containing many semiconductor devices requires a test jig. Our sample holders make electrical contact with the substrate via a pogo pin array, which carries the signals through an IDC connector to a multiplexor or test and measurement device, e.g. source measure unit. Made from hard-wearing, black anodised aluminium, these sample holders are well suited to solar cell characterisation under illumination in air.
Our standard holder mounts our standard patterned TCO substrates and illumination masks for solar cell characterisation.
Sample holders can be custom made to suit your device layout and measurement configuration. Get in touch and we can discuss your requirements.